Keem, John: search on Z-Library

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1

Structural and tribological studies of MoS2 solid lubricant films having tailored metal-multilayer nanostructures

Michael R. Hilton, Reinhold Bauer, Stephen V. Didziulis, Michael T. Dugger, John M. Keem, James Scholhamer

Journal:

Surface and Coatings Technology

Year:

1992

Language:

english

File:

PDF, 1.60 MB

english, 1992

2

Factors affecting the transformation of Escherichia coli strain χ1776 by pBR322 plasmid DNA

Norgard, Michael V., Keem, Kirsten, Monahan, John J.

Journal:

Year:

1978

Language:

english

File:

PDF, 1.29 MB

english, 1978

3

Influence of electrical isolation on the structure and reflectivity of multilayer coatings deposited on dielectric substrates

Gutman, Georgy, Keem, John, Wood, Jim, Tarrio, Charles, Watts, Richard

Journal:

Year:

1993

Language:

english

File:

PDF, 460 KB

english, 1993

4

SPIE Proceedings [SPIE 29th Annual Technical Symposium - San Diego (Tuesday 20 August 1985)] Applications of Thin Film Multilayered Structures to Figured X-Ray Optics - Thermal Stability of W/C Multilayer Films

Takagi, Yasuo, Flessa, Steven A., Hart, Keith L., Pawlik, David A., Kadin, Alan M., Wood, James L., Keem, John E., Tyler, John E., Marshall, Gerald F.

Year:

1985

Language:

english

File:

PDF, 144 KB

english, 1985

5

SPIE Proceedings [SPIE San Diego '92 - San Diego, CA (Sunday 19 July 1992)] Neutron Optical Devices and Applications - Determination of reflectivity curves of multilayer neutron monochromators

Popovici, Alexander M., Heuser, Brent J., Yelon, William B., Keem, John E., Majkrzak, Charles F., Wood, James L.

Year:

1992

Language:

english

File:

PDF, 502 KB

english, 1992

6

SPIE Proceedings [SPIE San Diego '92 - San Diego, CA (Sunday 19 July 1992)] Multilayer and Grazing Incidence X-Ray/EUV Optics for Astronomy and Projection Lithography - New method for achieving accurate thickness control for uniform and graded multilayer coatings on large flat substrates

Gutman, George, Keem, John E., Parker, Kevin, Wood, James L., Watts, Richard N., Tarrio, Charles, Hoover, Richard B., Walker II, Arthur B. C.

Year:

1993

Language:

english

File:

PDF, 413 KB

english, 1993

7

248. Particulate carbon size distribution characterization by small angle x-ray scattering

John E. Keem, George W. Smith

Journal:

Year:

1982

Language:

english

File:

PDF, 132 KB

english, 1982

8

Oxygen-mediated control of the keratinocyte proliferation-differentiation axis

Koh, Rosita, Szeverényi, Ildikó, Lee, Bernett, Denil, Simon L.I.J., John Lim, Soon Yew, Benny, Paula A., Grasset, Nicolas, Tan, Bien-Keem, Lane, E. Birgitte

Journal:

The Journal of Investigative Dermatology

Year:

2019

Language:

english

File:

PDF, 1.10 MB

english, 2019

9

A Dynamic Seebeck Coefficient Measuring Device For High Resistivity Materials

Journal:

Instrumentation Science & Technology

Year:

1975

Language:

english

File:

PDF, 321 KB

english, 1975

10

THERMAL, STABILITY OF W/C MULTILAYER FILMS

Takagi, Yasuo, Pawlik, David A., Kadin, Alan M., Flessa, Steven A., Hart, Keith L., Keem, John E., Tyler, John E.

Journal:

MRS Proceedings

Year:

1985

Language:

english

File:

PDF, 1.12 MB

english, 1985

11

Theoretical studies of hydrogen storage in binary Ti-Ni, Ti-Cu, and Ti-Fe alloys

Jozef Bicerano, John E. Keem, H. Bernhard Schlegel

Journal:

Theoretical Chemistry Accounts: Theory, Computation, and Modeling (Theoretica Chimica Acta)

Year:

1986

Language:

english

File:

PDF, 1.78 MB

english, 1986

12

SPIE Proceedings [SPIE 29th Annual Technical Symposium - San Diego (Tuesday 20 August 1985)] Applications of Thin Film Multilayered Structures to Figured X-Ray Optics - Measured X-ray Performance of Synthetic Multilayers Compared To Calculated Effects of Layer Imperfection

Wood, James L., Grupido, Nicola J., Hart, Keith L., Flessa, Steven A., Kadin, Alan M., Keem, John E., Ferris, David H., Marshall, Gerald F.

Year:

1985

Language:

english

File:

PDF, 296 KB

english, 1985

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